Abstract: In this letter, the leakage performances of 4H-SiC CMOS devices, as well as inverter (INV) and NOR logic gate circuits, are evaluated after being exposed to irradiation. It has been observed ...
Abstract: This paper presents the design of low-voltage and low-power cryogenic CMOS voltage reference circuits. This cryo-optimized circuit uses low-threshold devices to compensate for the ...
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